Bahar, R.I. and Tahoori, M.B. and Shukla, S.K. and Lombardi, F.. (2005) Guest Editors' Introduction: Challenges for Reliable Design at the Nanoscale. IEEE Design and Test of Computers, 22 (4). p. 295. ISSN 0740-7475
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Official URL: http://dx.doi.org/10.1109/MDT.2005.84
Item Type: | Article |
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InterNano Taxonomy: | Nanomanufacturing Characterization Techniques |
Collections: | Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for High-rate Nanomanufacturing |
Depositing User: | Amulya Gullapalli |
Date Deposited: | 17 Jul 2011 18:26 |
Last Modified: | 17 Jul 2011 18:26 |
URI: | http://eprints.internano.org/id/eprint/1015 |
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