Guest Editors' Introduction: Challenges for Reliable Design at the Nanoscale

Bahar, R.I. and Tahoori, M.B. and Shukla, S.K. and Lombardi, F.. (2005) Guest Editors' Introduction: Challenges for Reliable Design at the Nanoscale. IEEE Design and Test of Computers, 22 (4). p. 295. ISSN 0740-7475

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Item Type: Article
InterNano Taxonomy: Nanomanufacturing Characterization Techniques
Collections: Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for High-rate Nanomanufacturing
Depositing User: Amulya Gullapalli
Date Deposited: 17 Jul 2011 18:26
Last Modified: 17 Jul 2011 18:26
URI: http://eprints.internano.org/id/eprint/1015

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