Stamp Collapse in Soft Lithography

Huang, Yonggang Y. and Zhou, Weixing and Hsia, K. J. and Menard, Etienne and Park, Jang-Ung and Rogers, John A. and Alleyne, Andrew G.. (2005) Stamp Collapse in Soft Lithography. Langmuir, 21 (17). p. 8058. ISSN 0743-7463

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Item Type: Article
InterNano Taxonomy: Nanomanufacturing Processes > Nanopatterning/Lithography
Collections: Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Nanoscale Chemical-Electrical-Mechanical Manufacturing Systems
Depositing User: Amulya Gullapalli
Date Deposited: 21 Jul 2011 17:12
Last Modified: 21 Jul 2011 17:12

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