Molecular Scale Imaging With a Mutlilayer Superlens

Chaturvedi, P. and Fang, N.. (2005) Molecular Scale Imaging With a Mutlilayer Superlens. In: ASME 4th Integrated Nanosystems Conference.

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Item Type: Conference or Workshop Item (Paper)
InterNano Taxonomy: Nanomanufacturing Characterization Techniques > Optical Spectroscopy > Optical emission spectroscopy (OES)
Collections: Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Nanoscale Chemical-Electrical-Mechanical Manufacturing Systems
Depositing User: Amulya Gullapalli
Date Deposited: 21 Jul 2011 17:10
Last Modified: 21 Jul 2011 17:10

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