Chaturvedi, P. and Fang, N.. (2005) Molecular Scale Imaging With a Mutlilayer Superlens. In: ASME 4th Integrated Nanosystems Conference.
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Official URL: http://dx.doi.org/10.1115/NANO2005-87056
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| InterNano Taxonomy: | Nanomanufacturing Characterization Techniques > Optical Spectroscopy > Optical emission spectroscopy (OES) |
| Collections: | Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Nanoscale Chemical-Electrical-Mechanical Manufacturing Systems |
| Depositing User: | Amulya Gullapalli |
| Date Deposited: | 21 Jul 2011 17:10 |
| Last Modified: | 21 Jul 2011 17:10 |
| URI: | http://eprints.internano.org/id/eprint/1485 |
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