Contact potential measurement using a heated atomic force microscope tip

Remmert, Jessica L. and Wu, Yan and Lee, Jungchul and Shannon, Mark A. and King, William P.. (2007) Contact potential measurement using a heated atomic force microscope tip. Applied Physics Letters, 91 (14). p. 143111. ISSN 00036951

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Item Type: Article
InterNano Taxonomy: Areas of Application > Electronics and Semiconductor Industries
Collections: Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Nanoscale Chemical-Electrical-Mechanical Manufacturing Systems
Depositing User: Amulya Gullapalli
Date Deposited: 20 Jul 2011 21:55
Last Modified: 20 Jul 2011 21:55
URI: http://eprints.internano.org/id/eprint/1568

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