Remmert, Jessica L. and Wu, Yan and Lee, Jungchul and Shannon, Mark A. and King, William P.. (2007) Contact potential measurement using a heated atomic force microscope tip. Applied Physics Letters, 91 (14). p. 143111. ISSN 00036951
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Official URL: http://dx.doi.org/10.1063/1.2789927
Item Type: | Article |
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InterNano Taxonomy: | Areas of Application > Electronics and Semiconductor Industries |
Collections: | Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Nanoscale Chemical-Electrical-Mechanical Manufacturing Systems |
Depositing User: | Amulya Gullapalli |
Date Deposited: | 20 Jul 2011 21:55 |
Last Modified: | 20 Jul 2011 21:55 |
URI: | http://eprints.internano.org/id/eprint/1568 |
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