Ahn, Jong-Hyun and Zhu, Zhengtao and Park, Sang-Il and Xiao, Jianliang and Huang, Yonggang and Rogers, John A.. (2008) Defect Tolerance and Nanomechanics in Transistors that Use Semiconductor Nanomaterials and Ultrathin Dielectrics. Advanced Functional Materials, 18 (17). p. 2535. ISSN 1616301X
Full text not available from this repository.
Official URL: http://dx.doi.org/10.1002/adfm.200800176
| Item Type: | Article |
|---|---|
| InterNano Taxonomy: | Areas of Application > Electronics and Semiconductor Industries |
| Collections: | Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Nanoscale Chemical-Electrical-Mechanical Manufacturing Systems |
| Depositing User: | Amulya Gullapalli |
| Date Deposited: | 19 Jul 2011 19:24 |
| Last Modified: | 19 Jul 2011 19:24 |
| URI: | http://eprints.internano.org/id/eprint/1634 |
Actions (login required)
 |
View Item |
