Wu, Yan and Gupta, Chaitanya and Shannon, Mark A.. (2008) Effect of Solution Concentration, Surface Bias and Protonation on the Dynamic Response of Amplitude-Modulated Atomic Force Microscopy in Water. Langmuir, 24 (19). p. 10817. ISSN 0743-7463
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Official URL: http://dx.doi.org/10.1021/la801295c
| Item Type: | Article |
|---|---|
| InterNano Taxonomy: | Nanomanufacturing Characterization Techniques |
| Collections: | Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Nanoscale Chemical-Electrical-Mechanical Manufacturing Systems |
| Depositing User: | Amulya Gullapalli |
| Date Deposited: | 19 Jul 2011 18:37 |
| Last Modified: | 19 Jul 2011 18:37 |
| URI: | http://eprints.internano.org/id/eprint/1655 |
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