Khan, Md Muwyid U. and Narayanan, Pritish and Vijayakumar, Priyamvada and Koren, Israel and Krishna, C. Mani and Moritz, C. Andras. (2011) Biased Voting for Improved Yield in Nanoscale Fabrics. In: Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on.
Full text not available from this repository.| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Collections: | Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Hierarchical Manufacturing |
| Depositing User: | Robert Stevens |
| Last Modified: | 19 Apr 2012 20:07 |
| URI: | http://eprints.internano.org/id/eprint/1762 |
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