Sahoo, S. and Sharma, G. L. and Katiyar, R. S.. (2012) Raman Spectroscopy to Probe Residual Stress in ZnO Nanowire. Journal of Raman Spectroscopy, 43 (1). pp. 72-75.
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| Item Type: | Article |
|---|---|
| Additional Information: | Sahoo, Satyaprakash Sharma, G. L. Katiyar, Ram. S. |
| Collections: | Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Hierarchical Manufacturing |
| Depositing User: | Robert Stevens |
| Date Deposited: | 26 Mar 2014 |
| Last Modified: | 26 Mar 2014 19:43 |
| URI: | http://eprints.internano.org/id/eprint/2084 |
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