Variability in Nanoscale Architectures: Bottom-Up Integrated Analysis and Mitigation

Narayanan, P. ;. and Leuchtenburg, M. ;. and Kina, J. ;. and Joshi, P. ;. and Panchapakeshan, P. and Chui, C. O. and Moritz, C. A.. (2013) Variability in Nanoscale Architectures: Bottom-Up Integrated Analysis and Mitigation. ACM Journal on Emerging Technologies in Computing Systems, 9 (1). (In-Press).

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Item Type: Article
Collections: Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Hierarchical Manufacturing
Depositing User: Robert Stevens
Date Deposited: 26 Mar 2014
Last Modified: 26 Mar 2014 19:43
URI: http://eprints.internano.org/id/eprint/2113

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