Narayanan, P. ;. and Leuchtenburg, M. ;. and Kina, J. ;. and Joshi, P. ;. and Panchapakeshan, P. and Chui, C. O. and Moritz, C. A.. (2013) Variability in Nanoscale Architectures: Bottom-Up Integrated Analysis and Mitigation. ACM Journal on Emerging Technologies in Computing Systems, 9 (1). (In-Press).
Full text not available from this repository.Item Type: | Article |
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Collections: | Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Hierarchical Manufacturing |
Depositing User: | Robert Stevens |
Date Deposited: | 26 Mar 2014 |
Last Modified: | 26 Mar 2014 19:43 |
URI: | http://eprints.internano.org/id/eprint/2113 |
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