Narayanan, P. and Leuchtenburg, M. and Kina, J. and Joshi, P. and Panchapakeshan, P. and Chui, C. O. and Moritz, C. A.. (2013) Variability in Nanoscale Fabrics: Bottom-up Integrated Analysis and Mitigation. ACM Journal on Emerging Technologies in Computing Systems, 9 (1).
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| Item Type: | Article |
|---|---|
| Additional Information: | Narayanan, Pritish Leuchtenburg, Michael Kina, Jorge Joshi, Prachi Panchapakeshan, Pavan Chui, Chi On Moritz, C. Andras |
| Collections: | Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Hierarchical Manufacturing |
| Depositing User: | Robert Stevens |
| Date Deposited: | 27 Mar 2014 |
| Last Modified: | 27 Mar 2014 20:21 |
| URI: | http://eprints.internano.org/id/eprint/2123 |
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