Directly Measuring the Complete Stress-Strain Response of Ultrathin Polymer Films

Liu, Y. J. and Chen, Y. C. and Hutchens, S. and Lawrence, J. and Emrick, T. and Crosby, A. J.. (2015) Directly Measuring the Complete Stress-Strain Response of Ultrathin Polymer Films. Macromolecules, 48 (18). pp. 6534-6540.

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Abstract

The inherently fragile nature of ultrathin polymer films presents difficulties to the measurement of their mechanical properties, which are of interest in packaging, electronics, separations, and other manufacturing fields. More fundamentally, the direct measurement of ultrathin film mechanical properties is necessary for understanding changes in intrinsic material properties at reduced size scales, for example, when the film thickness alters the equilibrium configuration of the polymer chains. We introduce a method for ultrathin film tensile testing that stretches a two-dimensionally macroscopic, yet nanoscopically thin, polymer film on the surface of water. For polystyrene films, we observe a precipitous decrease in mechanical properties (Young's modulus, strain at failure, and nominal stress at failure) for film thicknesses down to 15 nm, less than the characteristic size of an individual polymer chain, yielding new insights into the changes in polymer chain entanglements in confined states.

Item Type: Article
Additional Information: ISI Document Delivery No.: CS2XPTimes Cited: 0Cited Reference Count: 48Liu, Yujie Chen, Yu-Cheng Hutchens, Shelby Lawrence, Jimmy Emrick, Todd Crosby, Alfred J.Center for Hierarchical Manufacturing, an NSF Nanoscale Science and Engineering Center CMMI-1025020; Army Research Office (USA) W911NF-14-1-0185We thank G. C. Evans, Y. Zhang, Z. H. Yang, and Y. Gong for help during the experiments. We acknowledge financial support from Center for Hierarchical Manufacturing, an NSF Nanoscale Science and Engineering Center (CMMI-1025020). J. Lawrence acknowledges financial support from Army Research Office (USA), W911NF-14-1-0185. We gratefully acknowledge useful conversations with J. Pham, D. R. King, D. Chen, and B. Davidovitch.01Amer chemical socWashington1520-5835
Uncontrolled Keywords: Polymer Science
Collections: Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Hierarchical Manufacturing
Depositing User: Robert Stevens
Date Deposited: 12 Nov 2015 18:38
Last Modified: 12 Nov 2015 18:38
URI: http://eprints.internano.org/id/eprint/2336

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