Concentric circle scanning system for large-area and high-precision imaging

Du, X. and Anthony, B.. (2015) Concentric circle scanning system for large-area and high-precision imaging. Optics Express, 23 (15). pp. 20014-20029.

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Abstract

Large-area manufacturing surfaces containing micro-and nanoscale features and large-view biomedical targets motivate the development of large-area, high-resolution and high-speed imaging systems. Compared to constant linear velocity scans and raster scans, constant angular velocity scans can significantly attenuate transient behavior while increasing the speed of imaging. In this paper, we theoretically analyze and evaluate the speed, acceleration and jerks of concentric circular trajectory sampling (CCTS). We then present a CCTS imaging system that demonstrates less vibration and lower mapping errors than raster scanning for creating a Cartesian composite image, while maintaining comparably fast scanning speed for large scanning area. (C) 2015 Optical Society of America

Item Type: Article
Additional Information: ISI Document Delivery No.: CR0TETimes Cited: 0Cited Reference Count: 23Du, Xian Anthony, BrianNational Science Foundation (NSF) Center for Hierarchical Manufacturing (CHM) CMMI-1025020This work was supported by the National Science Foundation (NSF) Center for Hierarchical Manufacturing (CHM) under NSF Award Number CMMI-1025020.01Optical soc amerWashington
Uncontrolled Keywords: Optics
Collections: Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Hierarchical Manufacturing
Depositing User: Robert Stevens
Date Deposited: 12 Nov 2015 18:38
Last Modified: 12 Nov 2015 18:38
URI: http://eprints.internano.org/id/eprint/2344

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