Singh, Deepak and Yngvesson, Sigfrid and Russell, Thomas and Tuominen, Mark. (2008) Anomalous suppression of the transition temperature of superconducting nanostructured honeycomb films: Electrical transport measurements and Maekawa-Fukuyama model. Physical Review B, 77 (17). p. 174512. ISSN 1098-0121
Full text not available from this repository. (Request a copy)Abstract
We report electrical transport measurements made on thin superconducting niobium films perforated by an etched array of nanoscopic holes. The hole diameter in these “honeycomb” network films is comparable to the coherence length of the parent superconducting material. A series of 12 films, with varying hole depths, were measured. As the film thickness is decreased, an unusually large reduction of transition temperature is observed for the honeycomb films as compared to plain etched films of similar thicknesses. We report on a Tc reduction in superconducting network films that is not due to an applied magnetic field. These observations are in contrast to previous reports based on Ginzburg-Landau theory analysis, which does not allow for any change in the transition temperature for perforated films in comparison to plain films. The Maekawa-Fukuyama (MF) model for two-dimensional (2D) superconductors is used to fit the sheet resistance data. The MF-2D model fits very well to the lightly etched samples, but an anomaly in Tc reduction is observed for heavily etched samples. These deviations are analyzed on the basis of change in dimensionality using the Aslamozov-Larkin model.
Item Type: | Article |
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InterNano Taxonomy: | Nanoscale Objects and Nanostructured Materials Nanoscale Objects and Nanostructured Materials > Nanocomposites > Thin films Nanomanufacturing Characterization Techniques > Charge Transport Characterization |
Collections: | Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Hierarchical Manufacturing Nanomanufacturing Research Collection |
Depositing User: | Moureen Kemei |
Date Deposited: | 03 Feb 2010 19:29 |
Last Modified: | 19 Sep 2011 21:45 |
URI: | http://eprints.internano.org/id/eprint/255 |
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