Odoi, M. Y. and Hammer, N. I. and Early, K. T. and McCarthy, K. D. and Tangirala, R. and Emrick, T. and Barnes, M. D.. (2007) Fluorescence Lifetimes and Correlated Photon Statistics from Single CdSe/Oligo(phenylene vinylene) Composite Nanostructures. Nano Letters, 7 (9). pp. 2769-2773. ISSN 1530-6984
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Official URL: http://dx.doi.org/10.1021/nl0713068
Abstract
We present measurements of fluorescence intensity trajectories and associated excited-state decay times from individual CdSe/oligo(phenylene vinylene) (CdSe−OPV) quantum dot nanostructures using time-tagged, time-resolved (TTTR) photon counting techniques. We find that fluorescence decay times for the quantum dot emitter in these composite systems are at least an order of magnitude shorter than ZnS-capped CdSe quantum dot systems. We show that both the blinking suppression and associated lifetime/count rate behavior can be described by a modified version of the diffusive reaction coordinate model which couples slow fluctuations in quantum dot electron (1Se, 1Pe) energies to Auger-assisted hole trapping processes, hence modifying both blinking statistics and excited-state decay rates.
| Item Type: | Article |
|---|---|
| Additional Information: | Reprinted with permission from, "Fluorescence Lifetimes and Correlated Photon Statistics from Single CdSe/Oligo(phenylene vinylene) Composite Nanostructures", M. K. Odoi et.all, Nano Letters 7, 2767. Copyright 2007 American Chemical Society." |
| InterNano Taxonomy: | Nanoscale Objects and Nanostructured Materials > Nanoparticles > Nanospheres Nanoscale Objects and Nanostructured Materials > Nanoparticles > Quantum confinement Nanomanufacturing Characterization Techniques > Other Characterization Techniques > Laser induced fluorescence (LIF) |
| Collections: | Nanomanufacturing Research Collection |
| ID Code: | 263 |
| Deposited By: | Moureen Kemei |
| Deposited On: | 08 Feb 2010 11:05 |
| Last Modified: | 08 Feb 2010 11:05 |
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