Spanakis, E. and Chimmalgi, A. and Stratakis, E. and Grigoropoulos, C. P. and Fotakis, C. and Tzanetakis, P.. (2006) Atomic force microscopy based, multiphoton, photoelectron emission imaging. Applied Physics Letters, 89 (1). 013110. ISSN 00036951
Full text not available from this repository. (Request a copy)Abstract
Images of photoelectron emission from metallic surfaces were obtained with a modified atomic force microscope operating in air. Illumination of the samples was achieved in the near field of a metal-coated microcantilever tip, placed in the beam of a femtosecond pulsed laser that is incident at a grazing angle with respect to the sample surface. Photoelectron currents were measured through the tip with a prototype amplifier. The power law dependence of average photocurrent on light intensity is compatible with multiphoton photoelectric effect and the work function of the metal covering a particular area on the two-metal patterned samples used.
Item Type: | Article |
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InterNano Taxonomy: | Nanomanufacturing Characterization Techniques > Scanning Probe Microscopy > Atomic force microscopy (AFM) Nanoscale Objects and Nanostructured Materials > Nanocomposites > Thin films Nanomanufacturing Characterization Techniques > Diffraction and Scattering |
Collections: | Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Scalable and Integrated Nanomanufacturing |
Depositing User: | Moureen Kemei |
Date Deposited: | 24 Mar 2010 21:36 |
Last Modified: | 26 Sep 2014 18:10 |
URI: | http://eprints.internano.org/id/eprint/366 |
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