Chen, L. and McGruer, N. E. and Adams, George G. and Du, Y.. (2008) Separation modes in microcontacts identified by the rate dependence of the pull-off force. Applied Physics Letters, 93 (5). 053503. ISSN 00036951
Full text not available from this repository. (Request a copy)Abstract
We report the observation of two distinct modes of rate-dependent behavior during contact cycling tests. One is a higher pull-off force at low cycling rates and the other is a higher pull-off force at high cycling rates. Subsequent investigation of these contacts using scanning electron microscopy (SEM) demonstrates that these two rate-dependent modes can be related to brittle and ductile separation modes. The former behavior is indicative of brittle separation, whereas the latter accompanies ductile separation. Thus by monitoring the rate dependence of the pull-off force, the type of separation mode can be identified during cycling without interrupting the test to perform SEM.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | Microelectromechanical Systems |
| InterNano Taxonomy: | Nanomanufacturing Characterization Techniques > Mechanical Property Characterization |
| Collections: | Nanomanufacturing Research Collection |
| Depositing User: | Moureen Kemei |
| Date Deposited: | 10 May 2010 15:02 |
| Last Modified: | 23 Mar 2011 17:03 |
| URI: | http://eprints.internano.org/id/eprint/450 |
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