Instrumentation and Metrology for Nanotechnology

Postek, Michael and Hocken, Robert, eds. (2006) Instrumentation and Metrology for Nanotechnology. Technical Report. National Nanotechnology Coordination Office.

[img]
Preview
PDF - Published Version
6Mb

Official URL: http://www.nano.gov/html/res/pubs.html

Abstract

Report of the National Nanotechnology Initiative Workshop, January 27-29, 2004

Item Type:Monograph (Technical Report)
InterNano Taxonomy:Nanomanufacturing Processes > Assembly Techniques
Nanomanufacturing Characterization Techniques
Tool development
Collections:Nanomanufacturing Report Collection
ID Code:69
Deposited By:Danielle Federa
Deposited On:12 May 2009 16:29
Last Modified:12 May 2009 16:29

Repository Staff Only: item control page