Postek, Michael and Hocken, Robert, eds. (2006) Instrumentation and Metrology for Nanotechnology. Technical Report. National Nanotechnology Coordination Office.
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Abstract
Report of the National Nanotechnology Initiative Workshop, January 27-29, 2004
Item Type: | Monograph (Technical Report) |
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InterNano Taxonomy: | Nanomanufacturing Processes > Assembly Techniques Nanomanufacturing Characterization Techniques Tool development |
Collections: | Nanomanufacturing Report Collection |
Depositing User: | Danielle Federa |
Date Deposited: | 12 May 2009 20:29 |
Last Modified: | 12 May 2009 20:29 |
URI: | http://eprints.internano.org/id/eprint/69 |
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