Instrumentation and Metrology for Nanotechnology

Postek, Michael and Hocken, Robert, eds. (2006) Instrumentation and Metrology for Nanotechnology. Technical Report. National Nanotechnology Coordination Office.

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Abstract

Report of the National Nanotechnology Initiative Workshop, January 27-29, 2004

Item Type: Monograph (Technical Report)
InterNano Taxonomy: Nanomanufacturing Processes > Assembly Techniques
Nanomanufacturing Characterization Techniques
Tool development
Collections: Nanomanufacturing Report Collection
Depositing User: Danielle Federa
Date Deposited: 12 May 2009 20:29
Last Modified: 12 May 2009 20:29
URI: http://eprints.internano.org/id/eprint/69

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