Quantitative Interfacial Energy Measurements of Adhesion-Promoted Thin Copper Films by Supercritical Fluid Deposition on Barrier Layers

Karanikas, Christos F. and Li, Han and Vlassak, Joost J. and Watkins, James J.. (2010) Quantitative Interfacial Energy Measurements of Adhesion-Promoted Thin Copper Films by Supercritical Fluid Deposition on Barrier Layers. Journal of Engineering Materials and Technology, 132 (2). 021014. ISSN 00944289

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Item Type: Article
InterNano Taxonomy: Nanomanufacturing Processes
Collections: Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Hierarchical Manufacturing
Depositing User: Amulya Gullapalli
Date Deposited: 15 Jul 2011 19:20
Last Modified: 15 Jul 2011 19:20
URI: http://eprints.internano.org/id/eprint/915

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