Narayanan, Pritish and Leuchtenburg, Michael and Kina, Jorge and Joshi, Prachi and Panchapakeshan, Pavan and Chui, Chi On and Moritz, C. Andras. (2010) Parameter Variability in Nanoscale Fabrics: Bottom-Up Integrated Exploration. In: Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on.
Full text not available from this repository.
Official URL: http://dx.doi.org/10.1109/DFT.2010.10
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| InterNano Taxonomy: | Nanomanufacturing Processes |
| Collections: | Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Hierarchical Manufacturing |
| Depositing User: | Amulya Gullapalli |
| Date Deposited: | 16 Jul 2011 00:54 |
| Last Modified: | 16 Jul 2011 00:54 |
| URI: | http://eprints.internano.org/id/eprint/934 |
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