Summers, J. A. and Yang, T. and Tuominen, M. T. and Hudgings, J. A.. (2010) High contrast, depth-resolved thermoreflectance imaging using a Nipkow disk confocal microscope. Review of Scientific Instruments, 81 (1). 014902. ISSN 00346748
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Official URL: http://dx.doi.org/10.1063/1.3276700
| Item Type: | Article |
|---|---|
| InterNano Taxonomy: | Nanomanufacturing Characterization Techniques > Thermal Analysis Social and Economic Impacts Tool development |
| Collections: | Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Hierarchical Manufacturing |
| Depositing User: | Amulya Gullapalli |
| Date Deposited: | 15 Jul 2011 17:47 |
| Last Modified: | 14 Sep 2011 16:26 |
| URI: | http://eprints.internano.org/id/eprint/945 |
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