Jin-Goo, Park. (2010) Fabrication and Characterization of the 32 x 32 Array Digital Si-PIN X-ray Detector for Single Photon Counting Image Sensor. Journal of the Korean Physical Society, 57 (1). p. 44. ISSN 0374-4884
Full text not available from this repository.
Official URL: http://dx.doi.org/10.3938/jkps.57.44
| Item Type: | Article |
|---|---|
| InterNano Taxonomy: | Nanomanufacturing Characterization Techniques |
| Collections: | Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for High-rate Nanomanufacturing |
| Depositing User: | Amulya Gullapalli |
| Date Deposited: | 17 Jul 2011 19:30 |
| Last Modified: | 17 Jul 2011 19:30 |
| URI: | http://eprints.internano.org/id/eprint/982 |
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