Browse by Year where Taxonomy is "Nanomanufacturing Characterization Techniques > Charge Transport Characterization"

2010

• Xu, Ji and Park, Soojin and Wang, Shiliu and Russell, Thomas P. and Ocko, Benjamin M. and Checco, Antonio. (2010) Directed Self-Assembly of Block Copolymers on Two-Dimensional Chemical Patterns Fabricated by Electro-Oxidation Nanolithography. Advanced Materials, 22 (20). p. 2268. ISSN 09359648

2008

• Murari, N.M. and Kumar, A. and Thomas, R. and Katiyar, R.S.. (2008) Fabrication of BiFeO3 capacitor structures with reduced leakage current. In: 17th IEEE International Symposium on the applications of ferroelectrics, FEB 23-28, 2008, Santa Re, NM, USA.
• Singh, Deepak and Yngvesson, Sigfrid and Russell, Thomas and Tuominen, Mark. (2008) Anomalous suppression of the transition temperature of superconducting nanostructured honeycomb films: Electrical transport measurements and Maekawa-Fukuyama model. Physical Review B, 77 (17). p. 174512. ISSN 1098-0121
• Sudeep, P. K. and Early, K. T. and McCarthy, K D and Odoi, M. Y. and Barnes, M D and Emrick, T. (2008) Monodisperse Oligo(phenylene vinylene) Ligands on CdSe Quantum Dots: Synthesis and Polarization Anisotropy Measurements. Journal of the American Chemical Society, 130 (8). pp. 2384-2385. ISSN 0002-7863

2007

• Karnik, Rohit and Duan, Chuanhua and Castelino, Kenneth and Daiguji, Hirofumi and Majumdar, Arun. (2007) Rectification of Ionic Current in a Nanofluidic Diode. Nano Letters, 7 (3). pp. 547-551. ISSN 1530-6984

2006

• Lee, Minhwan and Lee, Wonyoung and Prinz, Fritz B. (2006) Geometric artefact suppressed surface potential measurements. Nanotechnology, 17 (15). pp. 3728-3733. ISSN 0957-4484

2005

• Caflisch, R. E. and Gyure, Mark F. and Robinson, Hans D. and Yablonovitch, Eli. (2005) Modeling, Design, and Optimization of a Solid State Electron Spin Qubit. SIAM Journal on Applied Mathematics, 65 (4). pp. 1285-1304. ISSN 00361399

2004

• Pop, Eric and Dutton, Robert W. and Goodson, Kenneth E.. (2004) Analytic band Monte Carlo model for electron transport in Si including acoustic and optical phonon dispersion. Journal of Applied Physics, 96 (9). pp. 4998-5005. ISSN 00218979