InterNano Nanomanufacturing Library
Advanced Search
Browse
Collections
Document Type
Latest Additions
Person
Taxonomy
Year
Deposit an Item
About the Library
InterNano Home
Login
Create Account
Browse by Year where Taxonomy is "Nanomanufacturing Characterization Techniques > Diffraction and Scattering"
Up a level
InterNano Taxonomy
(452)
Nanomanufacturing Characterization Techniques
(110)
Diffraction and Scattering
(14)
Diffraction imaging
(1)
Neutron diffraction
(4)
Small angle x-ray scattering (SAXS)
(3)
Please select a value to browse from the list below.
2007
(4)
2006
(2)
2005
(1)
2007
Xiong, Yi
and
Liu, Zhaowei
and
Sun, Cheng
and
Zhang, Xiang
. (2007)
Two-Dimensional Imaging by Far-Field Superlens at Visible Wavelengths.
Nano Letters, 7 (11). pp. 3360-3365. ISSN 1530-6984
Liu, Z.
and
Xi, D.
and
Pile, D.
and
Luo, Q.
and
Fang, N.
and
Zhang, X.
. (2007)
Enhanced backward scattering by surface plasmons on silver film.
Applied Physics A, 87 (2). pp. 157-160. ISSN 0947-8396
Liu, Z.
and
Lee, H.
and
Xiong, Y.
and
Sun, C.
and
Zhang, X.
. (2007)
Far-Field Optical Hyperlens Magnifying Sub-Diffraction-Limited Objects.
Science, 315 (5819). p. 1686. ISSN 0036-8075
Liu, Zhaowei
and
Durant, Stéphane
and
Lee, Hyesog
and
Xiong, Yi
and
Pikus, Yuri
and
Sun, Cheng
and
Zhang, Xiang
. (2007)
Near-field Moiré effect mediated by surface plasmon polariton excitation.
Optics Letters, 32 (6). pp. 629-631. ISSN 0146-9592
2006
Spanakis, E.
and
Chimmalgi, A.
and
Stratakis, E.
and
Grigoropoulos, C. P.
and
Fotakis, C.
and
Tzanetakis, P.
. (2006)
Atomic force microscopy based, multiphoton, photoelectron emission imaging.
Applied Physics Letters, 89 (1). 013110. ISSN 00036951
Su, Kai-Hung
and
Durant, Stéphane
and
Steele, Jennifer M.
and
Xiong, Yi
and
Sun, Cheng
and
Zhang, Xiang
. (2006)
Raman Enhancement Factor of a Single Tunable Nanoplasmonic Resonator.
The Journal of Physical Chemistry B, 110 (9). pp. 3964-3968. ISSN 1520-6106
2005
Florescu, Lucia
and
Zhang, Xiang
. (2005)
Semiclassical model of stimulated Raman scattering in photonic crystals.
Physical Review E, 72 (1). 016611. ISSN 1539-3755