Items where Taxonomy is "Nanomanufacturing Characterization Techniques > Thermal Analysis" and Year is 2010

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Chandekar, Amol and Sengupta, Sandip K. and Whitten, James E.. (2010) Thermal stability of thiol and silane monolayers: A comparative study. Applied Surface Science, 256 (9). pp. 2742-2749. ISSN 01694332

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Summers, J. A. and Yang, T. and Tuominen, M. T. and Hudgings, J. A.. (2010) High contrast, depth-resolved thermoreflectance imaging using a Nipkow disk confocal microscope. Review of Scientific Instruments, 81 (1). 014902. ISSN 00346748

Summers, Joseph A. and Farzaneh, Maryam and Ram, Rajeev J. and Hudgings, Janice A.. (2010) Thermal and Optical Characterization of Photonic Integrated Circuits by Thermoreflectance Microscopy. IEEE Journal of Quantum Electronics, 46 (1). pp. 3-10. ISSN 0018-9197