Browse by Year where Taxonomy is "Nanomanufacturing Characterization Techniques > Scanning Probe Microscopy > Atomic force microscopy (AFM)"

2009

• Nagarajan, Sivakumar and Russell, Thomas P. and Watkins, James J.. (2009) Dual-Tone Patterned Mesoporous Silicate Films Templated From Chemically Amplified Block Copolymers. Advanced Functional Materials, 19 (17). pp. 2728-2734. ISSN 1616301X

2008

• Lam, Robert and Chen, Mark and Pierstorff, Erik and Huang, Houjin and Osawa, Eiji and Ho, Dean. (2008) Nanodiamond-Embedded Microfilm Devices for Localized Chemotherapeutic Elution. ACS Nano, 2 (10). pp. 2095-2102. ISSN 1936-0851
• Nagarajan, S. and Li, M. and Pai, R. A. and Bosworth, J. K. and Busch, P. and Smilgies, D.-M. and Ober, C. K. and Russell, T. P. and Watkins, J. J.. (2008) An Efficient Route to Mesoporous Silica Films with Perpendicular Nanochannels. Advanced Materials, 20 (2). pp. 246-251. ISSN 09359648

2007

• Backer, Scott A. and Suez, Itai and Fresco, Zachary M. and Rolandi, Marco and Fréchet, Jean M. J.. (2007) Covalent Formation of Nanoscale Fullerene and Dendrimer Patterns. Langmuir, 23 (5). pp. 2297-2299. ISSN 0743-7463

2006

• Spanakis, E. and Chimmalgi, A. and Stratakis, E. and Grigoropoulos, C. P. and Fotakis, C. and Tzanetakis, P.. (2006) Atomic force microscopy based, multiphoton, photoelectron emission imaging. Applied Physics Letters, 89 (1). 013110. ISSN 00036951

2004

• Fresco, Zachary M. and Suez, Itai and Backer, Scott A. and Fréchet, Jean M. J.. (2004) AFM-Induced Amine Deprotection: Triggering Localized Bond Cleavage by Application of Tip/Substrate Voltage Bias for the Surface Self-Assembly of Nanosized Dendritic Objects. Journal of the American Chemical Society, 126 (27). pp. 8374-8375. ISSN 0002-7863