Browse by Person

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Number of items: 4.

Hudgings, Janice A. and Arango, Alexi C. and Carter, Kenneth R.. Center for Hierarchical Manufacturing. (2012) Thermoreflectance Microscopy: Metrology for Optoelectronic Devices. Center for Hierarchical Manufacturing. (Unpublished)

Zhou, Qiaoer and Hu, Xiaolin and Al-Hemyari, Kadhair and McCarthy, Kevin and Domash, Lawrence and Hudgings, Janice A.. (2011) High spatial resolution characterization of silicon solar cells using thermoreflectance imaging. Journal of Applied Physics, 110 (5). 053108-6.

Summers, Joseph A. and Farzaneh, Maryam and Ram, Rajeev J. and Hudgings, Janice A.. (2010) Thermal and Optical Characterization of Photonic Integrated Circuits by Thermoreflectance Microscopy. IEEE Journal of Quantum Electronics, 46 (1). pp. 3-10. ISSN 0018-9197

Summers, Joseph A. and Yang, Tianyu and Tuominen, Mark T. and Hudgings, Janice A.. (2008) High-contrast thermoreflectance thermography using a Nipkow disk confocal microscope. In: IEEE Lasers and Electro-Optics Society, 2008. 21st Annual Meeting.

This list was generated on Sat Oct 25 21:50:28 2014 EDT.