Browse by Person

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Number of items: 1.

Bahar, R.I. and Tahoori, M.B. and Shukla, S.K. and Lombardi, F.. (2005) Guest Editors' Introduction: Challenges for Reliable Design at the Nanoscale. IEEE Design and Test of Computers, 22 (4). p. 295. ISSN 0740-7475

This list was generated on Thu Mar 28 14:50:01 2024 EDT.