Browse by Person

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Number of items: 1.

Narayanan, Pritish and Leuchtenburg, Michael and Kina, Jorge and Joshi, Prachi and Panchapakeshan, Pavan and Chui, Chi On and Moritz, C. Andras. (2010) Parameter Variability in Nanoscale Fabrics: Bottom-Up Integrated Exploration. In: Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on.

This list was generated on Fri Apr 19 12:32:33 2024 EDT.
University of Massachusetts NSF Logo
EPrints Logo Open Archives Initiative Logo
This project is supported by the National Science Foundation under Grant No. CMMI-1025020
Center for Hierarchical Manufacturing
InterNano Nanomanufacturing Library is powered by EPrints 3 which is developed by the School of Electronics and Computer Science at the University of Southampton. More information and software credits.