Electrochemical nanopatterning of Ag on solid-state ionic conductor RbAg[sub 4]I[sub 5] using atomic force microscopy

Lee, Minhwan and O’Hayre, Ryan and Prinz, Fritz B. and Gür, Turgut M.. (2004) Electrochemical nanopatterning of Ag on solid-state ionic conductor RbAg[sub 4]I[sub 5] using atomic force microscopy. Applied Physics Letters, 85 (16). pp. 3552-3554. ISSN 00036951

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Abstract

This report introduces an electrochemical nanopatterning technique performed under ambient conditions without involving a liquid vessel or probe-to-sample material transfer. Patterning is accomplished by solid-state electrochemical nanodeposition of Ag clusters on the surface of the solid ionic conductor RbAg4I5 using an atomic force microscopy probe. Application of negative voltage pulses on the probe relative to an Ag film counter electrode on an RbAg4I5 sample induces nanometer-sized Ag deposition on the ion conductor around the probe. The patterned Ag particles are 0.5-70 nm high and 20-700 nm in diameter. The effect of the amplitude and duration of bias voltage on the size and shape of deposited Ag clusters is also shown.

Item Type: Article
InterNano Taxonomy: Nanomanufacturing Processes > Self Assembly > Self-assembled monolayers (SAM)
Nanomanufacturing Processes > Nanopatterning/Lithography
Nanomanufacturing Characterization Techniques > Scanning Probe Microscopy
Collections: Nanomanufacturing Research Collection
Depositing User: Moureen Kemei
Date Deposited: 10 Mar 2010 21:58
Last Modified: 10 Mar 2010 21:58
URI: http://eprints.internano.org/id/eprint/336

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