Lee, Minhwan and O’Hayre, Ryan and Prinz, Fritz B. and Gür, Turgut M.. (2004) Electrochemical nanopatterning of Ag on solid-state ionic conductor RbAg[sub 4]I[sub 5] using atomic force microscopy. Applied Physics Letters, 85 (16). pp. 3552-3554. ISSN 00036951
Full text not available from this repository. (Request a copy)Abstract
This report introduces an electrochemical nanopatterning technique performed under ambient conditions without involving a liquid vessel or probe-to-sample material transfer. Patterning is accomplished by solid-state electrochemical nanodeposition of Ag clusters on the surface of the solid ionic conductor RbAg4I5 using an atomic force microscopy probe. Application of negative voltage pulses on the probe relative to an Ag film counter electrode on an RbAg4I5 sample induces nanometer-sized Ag deposition on the ion conductor around the probe. The patterned Ag particles are 0.5-70 nm high and 20-700 nm in diameter. The effect of the amplitude and duration of bias voltage on the size and shape of deposited Ag clusters is also shown.
| Item Type: | Article |
|---|---|
| InterNano Taxonomy: | Nanomanufacturing Processes > Self Assembly > Self-assembled monolayers (SAM) Nanomanufacturing Processes > Nanopatterning/Lithography Nanomanufacturing Characterization Techniques > Scanning Probe Microscopy |
| Collections: | Nanomanufacturing Research Collection Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Scalable and Integrated Nanomanufacturing |
| Depositing User: | Moureen Kemei |
| Date Deposited: | 10 Mar 2010 21:58 |
| Last Modified: | 26 Sep 2014 17:39 |
| URI: | http://eprints.internano.org/id/eprint/336 |
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