Backer, Scott A. and Suez, Itai and Fresco, Zachary M. and Rolandi, Marco and Fréchet, Jean M. J.. (2007) Covalent Formation of Nanoscale Fullerene and Dendrimer Patterns. Langmuir, 23 (5). pp. 2297-2299. ISSN 0743-7463
Full text not available from this repository. (Request a copy)
Official URL: http://dx.doi.org/10.1021/la0631973
Abstract
Localized patterns of amine-terminated monolayers obtained via the surface modification of a monolayer with the biased probe of an atomic force microscope were used to covalently attach buckminsterfullerene or dendrimers to the surface, affording lines as narrow as 20 nm.
Item Type: | Article |
---|---|
Additional Information: | Reprinted with permission from "Covalent Formation of Nanoscale Fullerene and Dendrimer Patterns", Backer SA et al., Langmuir, 2007, 23 (5), pp 2297–2299. Copyright 2007 American Chemical Society. |
InterNano Taxonomy: | Nanomanufacturing Characterization Techniques > Scanning Probe Microscopy > Atomic force microscopy (AFM) Nanomanufacturing Processes > Nanopatterning/Lithography Nanoscale Objects and Nanostructured Materials > Other Nanostructured Materials > Self assembled monolayers |
Collections: | Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Scalable and Integrated Nanomanufacturing |
Depositing User: | Moureen Kemei |
Date Deposited: | 29 Mar 2010 22:31 |
Last Modified: | 30 Sep 2014 14:53 |
URI: | http://eprints.internano.org/id/eprint/383 |
Actions (login required)
View Item |