Martinez-Morales, A. A. and Penchev, M. and Zhong, J. and Jing, X. and Singh, K. V. and Yengel, E. and Khan, M. I. and Ozkan, C. S. and Ozkan, M.. (2010) Electrical Characterization of Composition Modulated In<SUB>1−<I>x</I></SUB>Sb<SUB><I>x</I></SUB> Nanowire Field Effect Transistors by Scanning Gate Microscopy. Journal of Nanoscience and Nanotechnology, 10 (10). p. 6779. ISSN 15334880Full text not available from this repository.
|InterNano Taxonomy:||Nanomanufacturing Characterization Techniques|
|Collections:||Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Hierarchical Manufacturing|
|Depositing User:||Amulya Gullapalli|
|Date Deposited:||16 Jul 2011 20:58|
|Last Modified:||16 Jul 2011 20:58|
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