Martinez-Morales, A. A. and Penchev, M. and Zhong, J. and Jing, X. and Singh, K. V. and Yengel, E. and Khan, M. I. and Ozkan, C. S. and Ozkan, M.. (2010) Electrical Characterization of Composition Modulated In<SUB>1−<I>x</I></SUB>Sb<SUB><I>x</I></SUB> Nanowire Field Effect Transistors by Scanning Gate Microscopy. Journal of Nanoscience and Nanotechnology, 10 (10). p. 6779. ISSN 15334880
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Official URL: http://dx.doi.org/10.1166/jnn.2010.3108
| Item Type: | Article |
|---|---|
| InterNano Taxonomy: | Nanomanufacturing Characterization Techniques |
| Collections: | Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Hierarchical Manufacturing |
| ID Code: | 829 |
| Deposited By: | Amulya Gullapalli |
| Deposited On: | 16 Jul 2011 16:58 |
| Last Modified: | 16 Jul 2011 16:58 |
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