Electrical Characterization of Composition Modulated In<SUB>1−<I>x</I></SUB>Sb<SUB><I>x</I></SUB> Nanowire Field Effect Transistors by Scanning Gate Microscopy

Martinez-Morales, A. A. and Penchev, M. and Zhong, J. and Jing, X. and Singh, K. V. and Yengel, E. and Khan, M. I. and Ozkan, C. S. and Ozkan, M.. (2010) Electrical Characterization of Composition Modulated In<SUB>1−<I>x</I></SUB>Sb<SUB><I>x</I></SUB> Nanowire Field Effect Transistors by Scanning Gate Microscopy. Journal of Nanoscience and Nanotechnology, 10 (10). p. 6779. ISSN 15334880

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Item Type:	Article
InterNano Taxonomy:	Nanomanufacturing Characterization Techniques
Collections:	Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Hierarchical Manufacturing
Depositing User:	Amulya Gullapalli
Date Deposited:	16 Jul 2011 20:58
Last Modified:	16 Jul 2011 20:58
URI:	http://eprints.internano.org/id/eprint/829

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