Davis, A. R. and Pye, L. N. and Katz, N. and Hudgings, J. A. and Carter, K. R.. (2014) Spatially Mapping Charge Carrier Density and Defects in Organic Electronics Using Modulation-Amplified Reflectance Spectroscopy. Advanced Materials, 26 (26). 4539-+.
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| Item Type: | Article |
|---|---|
| Additional Information: | Davis, Andrew R. Pye, Lorelle N. Katz, Noam Hudgings, Janice A. Carter, Kenneth R. |
| Collections: | Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Hierarchical Manufacturing |
| Depositing User: | Robert Stevens |
| Date Deposited: | 19 Aug 2015 21:29 |
| Last Modified: | 19 Aug 2015 21:29 |
| URI: | http://eprints.internano.org/id/eprint/2265 |
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