Moscatello, Jason P. and Castaneda, Chloe V. and Zaidi, Alyina and Cao, Minxuan and Usluer, Ozlem and Briseno, Alejandro L. and Aidala, Katherine E.. (2017) Time-resolved kelvin probe force microscopy to study population and depopulation of traps in electron or hole majority organic semiconductors. Organic Electronics, 41. pp. 26-32. ISSN 15661199
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Official URL: http://doi.org/10.1016/j.orgel.2016.11.001
Item Type: | Article |
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Collections: | Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Hierarchical Manufacturing |
Depositing User: | Robert Stevens |
Date Deposited: | 16 Jun 2017 20:10 |
Last Modified: | 16 Jun 2017 20:10 |
URI: | http://eprints.internano.org/id/eprint/2384 |
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