Liu, Z. and Xi, D. and Pile, D. and Luo, Q. and Fang, N. and Zhang, X.. (2007) Enhanced backward scattering by surface plasmons on silver film. Applied Physics A, 87 (2). pp. 157-160. ISSN 0947-8396
Full text not available from this repository. (Request a copy)Abstract
Surface plasmon and its potential application in nanotechnology have attracted a remarkable amount of attention recently due to their novel properties. In this work we present an angularly resolved surface plasmon scattering study on a primitive metal surface. Using a reversed attenuated total reflection (RATR) setup in the experiment, we obtained a double-crescent shaped and enhanced scattering pattern at far field. The scattering pattern as a function on the variation of angle and polarization of incident beam are studied. Both theoretical and experimental results reveal an enhanced backward scattering by surface plasmon excitation. Consequently, it is shown that this angularly resolved surface plasmon scattering measurement can be employed for resolving a richness of nanoscale surface textures.
| Item Type: | Article |
|---|---|
| InterNano Taxonomy: | Nanoscale Objects and Nanostructured Materials > Nanocomposites > Thin films Nanomanufacturing Characterization Techniques > Diffraction and Scattering |
| Collections: | Nanomanufacturing Research Collection > Nanomanufacturing Nanoscale Science and Engineering Centers > Center for Scalable and Integrated Nanomanufacturing |
| Depositing User: | Moureen Kemei |
| Date Deposited: | 31 Mar 2010 20:02 |
| Last Modified: | 26 Sep 2014 21:01 |
| URI: | http://eprints.internano.org/id/eprint/389 |
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