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Khan, Md Muwyid U. and Narayanan, Pritish and Vijayakumar, Priyamvada and Koren, Israel and Krishna, C. Mani and Moritz, C. Andras. (2011) Biased Voting for Improved Yield in Nanoscale Fabrics. In: Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on.

This list was generated on Wed Oct 22 18:22:32 2014 EDT.