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Bahar, R.I. and Tahoori, M.B. and Shukla, S.K. and Lombardi, F.. (2005) Guest Editors' Introduction: Challenges for Reliable Design at the Nanoscale. IEEE Design and Test of Computers, 22 (4). p. 295. ISSN 0740-7475

This list was generated on Tue Sep 2 13:15:18 2014 EDT.