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Narayanan, Pritish and Leuchtenburg, Michael and Kina, Jorge and Joshi, Prachi and Panchapakeshan, Pavan and Chui, Chi On and Moritz, C. Andras. (2010) Parameter Variability in Nanoscale Fabrics: Bottom-Up Integrated Exploration. In: Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on.