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Khan, Md Muwyid U. and Narayanan, Pritish and Vijayakumar, Priyamvada and Koren, Israel and Krishna, C. Mani and Moritz, C. Andras. (2011) Biased Voting for Improved Yield in Nanoscale Fabrics. In: Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on.

Narayanan, Pritish and Leuchtenburg, Michael and Kina, Jorge and Joshi, Prachi and Panchapakeshan, Pavan and Chui, Chi On and Moritz, C. Andras. (2010) Parameter Variability in Nanoscale Fabrics: Bottom-Up Integrated Exploration. In: Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on.