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Number of items: 6.

Narayanan, P. ;. and Leuchtenburg, M. ;. and Kina, J. ;. and Joshi, P. ;. and Panchapakeshan, P. and Chui, C. O. and Moritz, C. A.. (2013) Variability in Nanoscale Architectures: Bottom-Up Integrated Analysis and Mitigation. ACM Journal on Emerging Technologies in Computing Systems, 9 (1). (In-Press).

Narayanan, P. and Leuchtenburg, M. and Kina, J. and Joshi, P. and Panchapakeshan, P. and Chui, C. O. and Moritz, C. A.. (2013) Variability in Nanoscale Fabrics: Bottom-up Integrated Analysis and Mitigation. ACM Journal on Emerging Technologies in Computing Systems, 9 (1).

Chui, C. O. and Shin, K. S. and Kina, J. and Shih, K. H. and Narayanan, P. and Moritz, C. A.. (2012) Heterogeneous Integration of Epitaxial Nanostructures: Strategies and Application Drivers. Nanoepitaxy: Materials and Devices IV. 84670R-84670R.

Narayanan, P. and Kina, J. and Panchapakeshan, P. and Chui, C. O. and Moritz, C. A.. (2012) Integrated Device-Fabric Explorations and Noise Impact and Mitigation in Nanoscale Fabrics. Nanotechnology, IEEE Transactions on, 11 (4). pp. 687-700.

Zhang, J. and Narayanan, P. and Khasanvis, S. and Kina, J. and Chui, C. O. and Moritz, C. A.. (2012) On-chip Variation Sensor for Systematic Variation Estimation in Nanoscale Fabrics. Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on. pp. 1-6.

Panchapakeshan, P. and Vijayakumar, P. and Narayanan, P. and Chui, C. O. and Koren, I. and Moritz, C. A.. (2011) 3-D integration requirements for hybrid nanoscale-CMOS fabrics. Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on. pp. 849-853.

This list was generated on Mon May 22 14:06:44 2017 EDT.